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Title: Apparatus for measuring electrical quantities at high-voltage potential
Claims: What is claimed is: 1. A measuring apparatus for measuring voltages on high-voltage conductors whereat fields are developed having an intensity indicative of the value of the high-voltage, the apparatus comprising: a sensing coil for conducting polarized light therein, said sensing coil being made from a wound light-wave conductor having respective ends; a single light-wave conductor for receiving polarized light having a polarization and for feeding the same to said sensing coil at one of said ends thereof; said sensing coil being placeable in the vicinity of the fields whereby the polarization of the polarized light is changed by an amount corresponding to the value of the voltage being measured; reflection means disposed at the other one of said ends of said sensing coil away from said single light-wave conductor for reflecting the polarized light fed to said sensing coil whereby the polarized light of changed polarization passes through said single light-wave conductor; evaluation means for translating the changed polarization into a quantity proportional to the electrical quantity being measured; an optical device arranged ahead of said single light-wave conductor for feeding the polarized light to said single light-wave conductor and for directing said polarized light of changed polarization from said single light-wave conductor to said evaluation means; and, an uncontrolled high-voltage insulator defining an axis, said sensing coil defining a longitudinal axis, said coil being arranged in said insulator so that the axis of said coil extends in the direction of the axis of said insulator, said high-voltage insulator comprising a plurality of control electrodes imbedded therein, said control electrodes being spaced one adjacent the other so as to define a region between each two mutually adjacent ones of said control electrodes, said coil being arranged in said regions. 2. The measuring apparatus of claim 1, said reflection means being a mirrored surface of said measuring sensor. 3. The measuring apparatus of claim 1, said light-wave conductor of said coil having a plurality of layers, said layers being disposed in corresponding ones of said regions. 4. The measuring apparatus of claim 1 comprising a polarized light supply means for supplying the polarized light, said supply means and said evaluation means being arranged at low-voltage potential. 5. A measuring apparatus for measuring voltages on high-voltage conductors whereat fields are developed having an intensity indicative of the value of the high-voltage, the apparatus comprising: a sensing coil for conducting polarized light therein, said sensing coil being made from a wound light-wave conductor having respective ends; a single light-wave conductor for receiving polarized light having a polarization and for feeding the same to said sensing coil at one of said ends thereof; said sensing coil being placeable in the vicinity of the fields whereby the polarization of the polarized light is changed by an amount corresponding to the value of the voltage being measured; reflection means dispoed at the other one of said ends of said sensing coil away from said single light-wave conductor for reflecting the polarized light fed to said sensing coil whereby the polarized light of changed polarization passes through said single light-wave conductor; evaluation means for translating the changed polarization into a quantity proportional to the electrical quantity being measured; an optical device arranged ahead of said single light-wave conductor for feeding the polarized light to said single light-wave conductor and for directing said polarized light of changed polarization from said single light-wave conductor to said evaluation means; and, a high-voltage insulator including a plurality of control electrodes imbedded therein, said electrodes being arranged one adjacent the other, said light-wave conductor of said sensing coil being directed along said electrodes so as to pass between each two mutually adjacent ones of said control electrodes. 6. The measuring apparatus of claim 5, said light-wave conductor of said sensing coil being configured so as to constitute a plurality of toroidal coils connected one to the other, said coils surrounding corresponding ones of said control electrodes. 7. The measuring apparatus of claim 5 comprising a polarized light supply meams for supplying the polarized light, said supply means and said evaluation means being arranged at low-voltage potential. 8. A measuring apparatus for measuring voltages on high-voltage conductors whereat fields are developed having an intensity indicative of the value of the high-voltage, the apparatus comprising: a sensing coil for conducting polarized light therein, said sensing coil being made from a wound light-wave conductor having respective ends; a single light-wave conductor for receiving polarized light having a polarization and for feeding the same to said sensing coil at one of said ends thereof; said sensing coil being placeable in the vicinity of the fields whereby the polarization of the polarized light is changed by an amount corresponding to the value of the voltage being measured; reflection means disposed at the other one of said ends of said sensing coil away from said single light-wave conductor for reflecting the polarized light fed to said sensing coil whereby the polarized light of changed polarization passes through said single light-wave conductor; evaluation means for translating the changed polarization into a quantity proportional to the electrical quantity being measured; an optical device arranged ahead of said single light-wave conductor for feeding the polarized light to said single light-wave conductor and for directing said polarized light of changed polarization from said single light-wave conductor to said evaluation means; and, a high-voltage insulator including voltage control elements in the form of wound capacitors, said light-wave conductor of said sensing element being configured to be a plurality of interconnected component coils wound into said capacitors. 9. A measuring apparatus for measuring voltages on high-voltage conductors whereat fields are developed having an intensity indicative of the value of the high-voltage, the apparatus comprising: a sensing coil for conducting polarized light therein, said sensing coil being made from a wound light-wave conductor having respective ends; a single light-wave conductor for receiving polarized light having a polarization and for feeding the same to said sensing coil at one of said ends thereof; said sensing coil being placeable in the vicinity of the fields whereby the polarization of the polarized light is changed by an amount corresponding to the value of the voltage being measured; reflection means disposed at the other one of said ends of said sensing coil away from said single light-wave conductor for reflecting the polarized light fed to said sensing coil whereby the polarized light of changed polarization passes through said single light-wave conductor; evaluation means for translating the changed polarization into a quantity proportional to the electrical quantity being measured; an optical device arranged ahead of said single light-wave conductor for feeding the polarized light to said single light-wave conductor and for directing said polarized light of changed polarization from said single light-wave conductor to said evaluation means; and, a high-voltage insulator including a plurality of plate capacitors having respective electrodes, said light-wave conductor of said sensing coil being arranged between mutually adjacent ones of said electrodes. 10. A measuring apparatus for measuring voltages on high-voltage conductors whereat fields are developed having an intensity indicative of the value of the high-voltage, the apparatus comprising: a sensing coil for conducting polarized light therein, said sensing coil being made from a wound light-wave conductor having respective ends; a single light-wave conductor for receiving polarized light having a polarization and for feeding the same to said sensing coil at one of said ends thereof; said sensing coil being placeable in the vicinity of the fields whereby the polarization of the polarized light is changed by an amount corresponding to the value of the voltage being measured; reflection means disposed at the other one of said ends of said sensing coil away from said single light-wave conductor for reflecting the polarized light fed to said sensing coil whereby the polarized light of changed polarization passes through said single light-wave conductor; evaluation means for translating the changed polarization into a quantity proportional to the electrical quantity being measured; an optical device arranged ahead of said single light-wave conductor for feeding the polarized light to said single light-wave conductor and for directing said polarized light of changed polarization from said single light-wave conductor to said evaluation means; and, a high-voltage insulator including a plurality of dish capacitors having respective electrodes, said light-wave conductor of said sensing coil being arranged between mutually adjacent ones of said electrodes. 11. A measuring apparatus for measuring voltages on high-voltage conductors whereat fields are developed having an intensity indicative of the value of the high-voltage, the apparatus comprising: a sensing coil for conducting polarized light therein, said sensing coil being made from a wound light-wave conductor having respective ends; a single light-wave conductor for receiving polarized light having a polarization and for feeding the same to said sensing coil at one of said ends thereof; said sensing coil being placeable in the vicinity of the fields whereby the polarization of the polarized light is changed by an amount corresponding to the value of the voltage being measured; reflection means disposed at the other one of said ends of said sensing coil away from said single light-wave conductor for reflecting the polarized light fed to said sensing coil whereby the polarized light of changed polarization passes through said single light-wave conductor; evaluation means for translating the changed polarization into a quantity proportional to the electrical quantity being measured; an optical device arranged ahead of said single light-wave conductor for feeding the polarized light to said single light-wave conductor and for directing said polarized light of changed polarization from said single light-wave conductor to said evaluation means; and, a current measuring unit for measuring the current in the high-voltage conductor and having a current sensing part; a feedthrough arrangement arranged with respect to the high-voltage conductor so as to establish the electric field therein caused by the voltage on the line; and, a housing mounted on said feedthrough arrangement, said housing being configured for receiving the high-voltage conductor and for containing said current sensing part therein; said light-wave conductor of said sensing coil being arranged in said field in said feedthrough arrangement so as to cause the polarized light passing through the same to experience a rotation of its polarization plane by an amount indicative of the voltage on the high-voltage conductor. 12. The measuring apparatus of claim 11, said feed-through arrangement having an axis, said light-wave conductor of said sensing coil defining a longitudinal axis, said coil being disposed in said feed-through arrangement so that the axis of said coil extends in the same direction as said axis of said feedthrough arrangement. 13. The measuring apparatus of claim 11, said feed-through arrangement comprising a plurality of control electrodes imbedded therein, said control electrodes being spaced one adjacent the other so as to define a region between each two mutually adjacent ones of said control electrodes, said light-wave conductor of said sensing coil being configured as a coil arranged in said regions. 14. The measuring apparatus of claim 13, the light-wave conductor of said coil being wound into a plurality of layers, said layers being disposed in corresponding ones of said regions. 15. The measuring apparatus of claim 11, said feed-through arrangement having a plurality of control electrodes imbedded therein, said electrodes being arranged one adjacent the other, said light-wave conductor of said sensing coil being directed along said electrodes so as to pass between each two mutually adjacent ones of said control electrodes. 16. The control apparatus of claim 15, said light-wave conductor of said sensing coil being configured so as to constitute a plurality of toroidal coils connected one to the other, said coils being would upon corresponding ones of said control electrodes. 17. The measuring apparatus of claim 11, said feed-through arrangement including voltage control elements in the form of wound capacitors, said light-wave conductor of said sensing coil being configured to be a plurality of interconnected component coils wound into said capacitors. 18. The measuring apparatus of claim 11, said feed-through arrangement including a plurality of plate capacitors having respective electrodes, said light-wave conductor of said sensing coil being arranged between mutually adjacent ones of said electrodes. 19. The measuring apparatus of claim 11, said feed-through arrangement including a plurality of dish capacitors having respective electrodes, said light-wave conductor of said sensing coil being arranged between mutually adjacent ones of said electrodes. 20. The measuring apparatus of claim 11 comprising a polarized light supply means for supplying the polarized light, said supply means and said evaluation means being arranged at low-voltage potential. 21. The measuring apparatus of claim 11, said current measuring unit comprising a light-wave conductor wound into a coil arranged with respect to the high-voltage conductor so that the conductor passes through the coil. 22. The measuring apparatus of claim 21 comprising a polarized light supply means for supplying the polarized light, said supply means and said evaluation means being arranged at low-voltage potential. 23. A measuring apparatus for measuring voltages on high-voltage conductors whereat fields are developed having an intensity indicative of the value of the high-voltage, the apparatus comprising: a sensing coil for conducting polarized light therein, said sensing coil being made from a would light-wave conductor having respective ends; a single light-wave conductor for receiving polarized light having a polarization and for feeding the same to said sensing coil at one of said ends thereof; said sensing coil being placeable in the vicinity of the fields whereby the polarization of the polarized light is changed by an amount corresponding to the value of the voltage being measured; reflection means disposed at the other one of said ends of said sensing coil away from said single light-wave conductor for reflecting the polarized light fed to said sensing coil whereby the polarized light of changed polarization passes through said single light-wave conductor; evaluation means for translating the changed polarization into a quantity proportional to the electrical quantity being measured; an optical device arranged ahead of said single light-wave conductor for feeding the polarized light to said single light-wave conductor and for directing said polarized light of changed polarization from said single light-wave conductor to said evaluation means; and, a current measuring unit for measuring current in the high-voltage conductor and having a current sensing part; a feedthrough arrangement; and, a housing mounted on said feedthrough arrangement, said housing containing said current sensing part and being configured for receiving the high-voltage conductor therein whereby the electric field caused by the voltage on the line is established inside said housing, said light-wave conductor of said sensing coil being arranged in said field in said housing so as to cause the polarized light passing through the same to experience a rotation of its polarization plane by an amount indicative of the voltage on the high-voltage conductor. 24. The measuring apparatus of claim 23, said current measuring unit including a conductive, annular shell for receiving said current sensing part therein, said annular shell being disposed within said housing so as to define a space between said shell and said housing through which the field lines of said electric field pass, said light-wave conductor of said sensing coil being a toroidal coil having turns arranged in said space so as to cause said field lines to pass transversally therethrough. 25. The measuring apparatus of claim 23 comprising a polarized light supply means for supplying the polarized light, said supply means and said evaluation means being arranged at low-voltage potential. 26. The measuring apparatus of claim 23, said current measuring unit comprising a light-wave conductor wound into a coil arranged with respect to the high-voltage conductor so that the conductor passes through the coil. 27. The measuring apparatus of claim 23 comprising a shell for receiving the high-voltage conductor, said shell being arranged in said housing so as to cause said housing to surround said shell, said shell and said housing conjointly defining a space through which the electric field lines of said field pass, said light-wave conductor of said sensing coil having turns arranged in said space so as to cause the electric field lines to pass transversally through the same. 28. The measuring apparatus of claim 26, said lastmentioned light-wave conductor being disposed in surrounding relation to said shell in a manner to cause the polarization plane of the polarized light passing therethrough to be rotated in dependence upon the magnitude of the current in the highvoltage conductor. 29. The measuring apparatus of claim 28 comprising a polarized light supply means for supplying the polarized light, said supply means and said evaluation means being arranged at low-voltage potential. Other info: Inventors: Krause, Dieter (Berlin, DT) Application Number: 423172 Filing Date: 1973-12-10 Publication_date: 1976-02-03 Assignee: Siemens Aktiengesellschaft (Munich, DT) Primary Class(es): 324/96 359/280, 385/1 Other Classes: US Patent Ref:
Other Refs: Primary Examiner: Rolinec, R. V. Assistant Examiner: Hille, Rolf Attorney: Kenyon & Kenyon Reilly Carr & Chapin |
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