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Title: Method for contactless measurement of conductivity and/or temperature on metals by means of eddy currents
Claims: We claim: 1. A method for contactless measurement of conductivity and/or temperature on metals by means of eddy currents, whereby with the aid of a measuring head including thereon an excitation coil fed with an alternating current and having its axis standing vertically on the test specimen, an alternating magnetic field is generated which penetrates into the surface of the metal and by inductive means gives rise to eddy currents, and in addition to the excitation coil there are two measuring coils of equal radius arranged coaxially and symmetrically with respect to the excitation coil, the length of each measuring coil being substantially smaller than the length of the excitation coil, the measuring coils are connected in series opposition and the phase angle between the signal in the excitation coil and signal in the measuring coils is used as an indication of the measured variable, characterized in that the radius ratio between the excitation coil on the one hand, and the measuring coils on the other, is smaller than 1/4 or greater than 4, depending on whether the measuring coils are located outside or insdie the excitation coil, and the distance between the measuring head and the specimen surface is adjusted until the said phase angle between the excitation-coil signal and the measuring-coil signal exhibits a maximum. 2. A method as claimed in claim 1, in which the phase angle between the excitation-coil signal and the measuring-coil signal is measured with a measuring device which converts the phase difference at any given time into a proportional voltage and displays it on an instrument, the scale of the instrument is calibrated in such a manner that for various reference specimens of known conductivity the distance between measuring head and reference specimen is adjusted progressively until a maximum deflection of the instrument is achieved, this maximum deflection being marked on the scale and provided with the corresponding conductivity value, and in which measurement on a specimen of unknown conductivity similarly consists in progressively moving the measuring head in the direction of the specimen surface until a maximum deflection is obtained, whereupon the conductivity can be read from the calibrated scale. 3. A method as claimed in claim 1, in which in order to determine the conductivity of a specimen a reference specimen of known conductivity is first mounted in front of the measuring head, which is able to move in the perpendicular direction, and the measuring head is moved vertically relative to the surface of the reference specimen until the deflection of a phase-angle measuring device shows a maximum, the head is fixed at this maximum, the phase angle is measured and the value is retrievably stored, and in which when measuring the unknown conductivity of a specimen this is set immediately in the position of the reference specimen so that the distance between specimen surface and measuring head is the same as with the reference specimen, and the excitation frequency is varied until the phase-angle measuring device shows the same deflection as previously with the reference specimen, the phase angle maximum being obtained automatically as a function of an imaginary variation of the distance between measuring head and specimen and the ratio of the conductivities of the reference speciman and the `unknown` specimen being inversely proportional to the ratio of the two excitation frequencies, from which the unknown conductivity can be determined directly. Other info: Inventors: Brandli, Gerold (Windisch, CH) Keller, Pierre (Baden, CH) Application Number: 542774 Filing Date: 1975-01-21 Publication_date: 1976-02-03 Assignee: BBC Brown Boveri & Company Limited (Baden, CH) Primary Class(es): 324/243 324/203, 324/225, 324/233, 374/176 Other Classes: US Patent Ref:
Other Refs: Other References: Dodd, C.V.; A Portable Phase-Sensitive E.C. Instrument; Mat. Eval. Mar. 1968; pp. 33-36. Dodd et al., Thickness Measurements Using E.C. Techniques; Mat. Eval. May 1973; pp. 73-84. Dodd, C.V.; Applications of a Phase-Sensitive E.C. Instrument; Mat. Eval; June, 1964; pp. 260-262 & 272. | |