Title: Electron microscope or the like and method of use

Abstract: The invention contemplates method and means for using an electron microscope in conjunction with a projection system whereby the microscope produces a distortion-corrected image of an object at a relatively low magnification level, the distortion-corrected image being at the object plane of the projection system, whereby magnification may be varied in accordance with excitation of the projection system, and whereby a delicate object specimen may be fixedly positioned and exposed to large-area low-level illuminating flux within the objective lens system of the microscope.

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Inventors: Egle, Wilhelm (Konigsbronn, DE, US)

Application Number: 943579
Filing Date: 1978-09-18
Publication_date: 1980-03-18
Assignee: Zeiss-Stiftung; Carl (Oberkochen, DE)
Primary Class(es): 250/311 250/396R
Other Classes:
US Patent Ref:

2494442

Jan, 1950

Le Poole

250/311.

Other Refs:
Primary Examiner: Dixon, Harold A.
Assistant Examiner:
Attorney: Hopgood, Calimafde, Kalil, Blaustein & Lieberman