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Title:
X-ray lithography
Abstract:
X-ray lithographic systems as heretofore constructed include a low-attenuation chamber for propagating x-rays from a source toward a mask member that is positioned in close proximity to a resist-coated wafer. Both the mask and the wafer are included in the chamber which typically is either filled with helium or evacuated to a pressure less than about 10.sup.-2 Torr. In accordance with this invention, an x-ray lithographic system is constructed to enable establishment in the wafer-to-mask region of a controlled atmosphere that is separate and distinct from that maintained in the low-attenuation chamber. In this way, an improved lithographic system with advantageous throughput and other characteristics is realized.
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Inventors:
Dean, Robert E. (High Bridge, NJ, US) Maydan, Dan (Short Hills, NJ, US) Moran, Joseph M. (Berkeley Heights, NJ, US) Taylor, Gary N. (Fanwood, NJ, US)
Application Number:
857380
Filing Date: 1977-12-05 Publication_date: 1980-01-22 Assignee:
Bell Telephone Laboratories, Incorporated (Murray Hill, NJ)
Primary Class(es):
378/34
Other Classes:
US Patent Ref:
| 3743842 | Jul, 1973 | Smith et al. | 250/492. | | 4066905 | Jan, 1978 | Dassler et al. | 250/441. | | 4119855 | Oct, 1978 | Bernacki | 250/492. |
Other Refs:
Primary Examiner:
Church, Craig E.
Assistant Examiner:
O'Hare, Thomas P.
Attorney:
Canepa; Lucian C.
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