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Primary Examiner: Dixon, Harold A.
Assistant Examiner:
Attorney: Spain; Norman N.

Next ten patents ordered by date:

X-ray lithography
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Title: X-ray detector

Abstract: The X-ray detection element of an X-ray detector is composed of a fluorescent material having a short afterglow and a high sensitivity to the X-radiation to be detected. For the fluorescent material use is notably made of cerium-activated phosphors such as yttrium phosphors, lanthanum phosphors or lutetium phosphors.

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Inventors: Stevels, Albert L. N. (Eindhoven, NL)

Application Number: 885669
Filing Date: 1978-03-13
Publication_date: 1980-01-22
Assignee: U.S. Philips Corporation (New York, NY)
Primary Class(es): 250/483.1
Other Classes:
US Patent Ref:

2559219	Jul, 1951	Ludeman	250/483.
2739258	Mar, 1956	Sheldon et al.	250/483.
2921201	Jan, 1960	Lieb	250/483.
3527710	Sep, 1970	Toma et al.	250/483.
3974389	Aug, 1976	Ferri et al.	250/483.
4029851	Jun, 1977	Degenhardt	250/483.
4076897	Feb, 1978	Ray	250/483.

Other Refs: Other References: Image Intensifier by Dreyfus, IBM Tech. Disc. Bull., vol. 16, No. 9, Feb. 1974, p. 3102.