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Title: Electron beam matrix deflector manufactured by etching divergent slots

Abstract: A matrix deflector, for deflecting an electron beam passing therethrough, is fabricated of a pair of members of photosensitive insulating material which are each exposed to a pattern of photons, and then developed to form a pattern of substantially parallel slots through each member; the members are positioned one above the other with the slots thereof orthogonally arrayed. The slots diverge in the direction of electron beam passage through each member to provide an exit aperture wider than the entrance aperture and prevent the deflected beam from striking the edge of the lens member at maximum deflection. The apertures form a set of parallel bars which are coated with a conductive material to facilitate production of deflecting electrostatic fields within each slot.


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Inventors: Lemmond, Charles Q. (Scotia, NY, US)

Application Number: 885902
Filing Date: 1978-03-13
Publication_date: 1980-01-08
Assignee: General Electric Company (Schenectady, NY)
Primary Class(es): 445/47 216/18, 216/76
Other Classes:
US Patent Ref:
2628160Feb, 1953Stookey156/663.
2806958Sep, 1957Zunick156/663.
3680184Aug, 1972Greene29/25.
3802972Apr, 1974Fleischer et al.156/644.

Other Refs:
Primary Examiner: Lazarus, Richard B.
Assistant Examiner:
Attorney: Krauss; Geoffrey H., Cohen; Joseph T., Snyder; Marvin