Title: Automatic transient response analyzer system

Abstract: An automatic transient response analyzer system takes advantage of a digital computer and circuitry controlled thereby to measure the time that a device under test takes to come within specified limits of a final output when driven by a signal which stepwise increases or decreases in amplitude by a known amount.

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Inventors: Frye, George J. (Portland, OR, US)
Geerling, Leonardus J.

Application Number: 834799
Filing Date: 1977-09-19
Publication_date: 1979-07-10
Assignee:
Primary Class(es): 702/117
Other Classes:
US Patent Ref:

3393301	Jul, 1968	Valstar	364/579.
3790767	Feb, 1974	Alexander	364/579.
3976940	Aug, 1976	Chau et al.	324/73.
4044244	Aug, 1977	Foreman et al.	235/302.
4058767	Nov, 1977	Muehldorf et al.	324/73.
4070565	Jan, 1978	Borrelli	235/302.

Other Refs:
Primary Examiner: Atkinson, Charles E.
Assistant Examiner:
Attorney: LaRue; Adrian J.