Title: Chip thickness classifier

Abstract: A chip thickness classifier comprising a drum mounted for rotation about its longitudinal axis and having its periphery formed by a plurality of discrete longitudinally extending bars of elongated cross-section. The bars are arranged in substantially shingled relationship with one side of each bar spaced closer to the axis of rotation of the drum than the other side of the bar thereby to form outlet passages between adjacent bars. The outlet passages are substantially axially extending slots having their major width dimension measured substantially radially of the axis of rotation of the drum. Each of said bars is mounted for rotation about a longitudinally extending axis of the bar and the bars are interconnected by an adjustment mechanism that applies simultaneous incremental movement to stepwise rotate said bars and change said width dimension of the outlet passage. The drum is rotated in the direction wherein the side of each said bar closest the axis of rotation of the drum leads.

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Other info:

Inventors: Lapointe, Joseph A. (Montreal, CA, US)

Application Number: 866838
Filing Date: 1978-01-04
Publication_date: 1979-02-27
Assignee: Domtar Inc. (Montreal, CA)
Primary Class(es): 209/664 209/667
Other Classes:
US Patent Ref:

196456	Oct, 1877	Howard et al.	209/99.
1173737	Feb, 1916	Quesnell	209/106.
1185770	Jun, 1916	Cody	209/99.
1472279	Oct, 1923	Nordstrom	209/98.
2895610	Jul, 1959	Copping et al.	209/98.
2984351	May, 1961	Van Slyck et al.	209/98.

Other Refs:
Primary Examiner: Rolla, Joseph J.
Assistant Examiner:
Attorney: Rowley; C. A.