Title: Tomographic x-ray apparatus for producing transverse layer images

Abstract: In the illustrated embodiment, a series of detectors subject to additive errors in measurement due to high voltage variations is provided with a reference channel having a detector or an equivalent component which is not exposed to the radiation, but which is responsive to high voltage fluctuations. The output from the reference channel during each measurement cycle is supplied to multiplier circuitry which receives from each channel as a second input a stored constant representing the deviation in sensitivity of the channel detector as compared to the reference detector or equivalent. The output from the multiplier is combined with the measured value from such channel by means of a subtractor circuit so as to correct the output from the channel for the errors introduced by fluctuations in the high voltage supply.

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Inventors: Weinkauf, Burghard (Erlangen, DE, US)

Application Number: 787854
Filing Date: 1977-04-15
Publication_date: 1979-02-06
Assignee: Siemens Aktiengesellschaft (Berlin & Munich, DE)
Primary Class(es): 378/19 378/91
Other Classes:
US Patent Ref:

3946234

Mar, 1976

Hounsfield

250/445.

Other Refs:
Primary Examiner: Church, Craig E.
Assistant Examiner:
Attorney: Hill, Gross, Simpson, Van Santen, Steadman, Chiara & Simpson