Title: Device for the measurement of the wall thickness of tubes

Abstract: A device for the measurement of the wall thickness of tubes, in particular for the measurement of extruded synthetic tubes during the extrusion process, comprises a common support for location within the tube and a plurality of measuring bodies mounted on the support and urged resiliently outwards for engagement with the tube wall. In order to provide a sufficiently robust support for the measuring bodies they are connected to the support by means of a parallelogram linkage, and in order to allow the measuring bodies a degree of free movement so that they can conform to the contour of the tube wall at least one parallelogram arm of the parallelogram linkage is pivoted with free play.

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Inventors: Zumbach, Heinz (Biel, CH)

Application Number: 858853
Filing Date: 1977-12-08
Publication_date: 1979-02-06
Assignee: Zumbach Electronic AG (Orpund, CH)
Primary Class(es): 33/501.02 33/544.3, 324/231
Other Classes:
US Patent Ref:

2423671	Jan, 1969	Vezin	33/178.
2519221	Aug, 1950	Bogen et al.	33/178.
2563254	Aug, 1951	Lewis	33/147.
2855685	Oct, 1958	Barreteau	33/178.
3882606	May, 1975	Kaenel et al.	33/174.

Other Refs: 1059672200536

Jun, 1959	DE
Oct, 1967	SU

Primary Examiner: Stearns, Richard R.
Assistant Examiner:
Attorney: