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Title: Determination of mineral concentrations in slurries thereof

Abstract: A method of x-ray diffraction determination of the concentration of predetermined minerals in slurries comprises presenting a sample in the form of a stream of slurry having areas of two opposing sides thereof unsupported by any boundary walls therefor, and making required determinations through the unsupported areas of the stream of slurry using x-radiation of a suitable wavelength.


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Inventors: De Villiers, Johan P. R. (Johnannesburg, ZA)
Ormrod, George T. W. (Randburgh, ZA)

Application Number: 729862
Filing Date: 1976-10-05
Publication_date: 1978-05-16
Assignee: National Institute for Metallurgy (Johannesburg, ZA)
Primary Class(es): 378/71 378/47
Other Classes:
US Patent Ref:
3855470Dec, 1974Sahores et al.250/272.
3925661Dec, 1975Carr-Brion250/272.
3980882Sep, 1976Carr-Brion et al.250/272.
3982126Sep, 1976VON Alfthan250/272.

Other Refs:
Primary Examiner: Brochelt, Archie R.
Assistant Examiner:
Attorney: Cushman, Darby & Cushman