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Title:
Control store system and method for storing selectively microinstructions and scratchpad information
Abstract:
A system and method for providing a control store arrangement in which a single memory having a plurality of memory locations can be used for storing sequences of microinstructions or scratch pad information. The number of storage locations defining the scratch pad area can be increased or decreased as required by assigning tag addresses to a desired number of scratch pad storage locations when the microinstruction routines are being assembled. In this manner, the locations defining the scratch pad areas can be tailored to the particular system operation to be performed. This eliminates the need for modifying the control store circuits to change the size of the control store scratch pad area.
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Inventors:
Taylor, Donald R. (Framingham, MA, US) Parmet, Arthur A. (Waltham, MA, US)
Application Number:
644777
Filing Date: 1975-12-29 Publication_date: 1978-04-11 Assignee:
Honeywell Information Systems Inc. (Waltham, MA)
Primary Class(es):
712/248
Other Classes:
US Patent Ref:
| 3293610 | Dec, 1966 | Epperson et al. | 364/200. | | 3380025 | Apr, 1968 | Ragland | 340/172. | | 3391394 | Jul, 1968 | Ottaway et al. | 340/172. | | 3434112 | Mar, 1969 | Yen | 340/172. | | 3560933 | Feb, 1971 | Schwartz | 340/172. | | 3646522 | Feb, 1972 | Furman et al. | 340/172. | | 3828320 | Aug, 1974 | Dinerman et al. | 340/172. | | 3859636 | Jan, 1975 | Cook | 340/172. | | 3872447 | Mar, 1975 | Tessera et al. | 340/172. | | 3900835 | Aug, 1975 | Bell et al. | 340/172. | | 3911406 | Oct, 1975 | McLaughlin et al. | 340/172. | | 3914747 | Oct, 1975 | Barnes et al. | 340/172. |
Other Refs:
Primary Examiner:
Chapnick, Melvin B.
Assistant Examiner:
Attorney:
Driscoll; Faith F., Prasinos; Nicholas, Reiling; Ronald T.
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