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Title: Scanning X-ray examination apparatus

Abstract: The output dose behind the body to be examined in a scanning X-ray examination device is kept constant by controlling the incident dose. As a result, in comparison with known devices an examination can be performed quicker and with a smaller total radiation dose, and a better image of the absorption variations can be obtained.


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Inventors: Kemner, Rudolf (Eindhoven, NL)
Zonneveld, Frans Wessel (Eindhoven, NL)

Application Number: 642159
Filing Date: 1975-12-18
Publication_date: 1977-09-27
Assignee: U.S. Philips Corporation (New York, NY)
Primary Class(es): 378/16 378/108
Other Classes:
US Patent Ref:
3558885Jan, 1971Flemming250/354.
3567940Mar, 1971Lambert250/409.
3783286Jan, 1974Kremer250/409.

Other Refs: 834,815
May, 1960UK

Primary Examiner: LaRoche, Eugene R.
Assistant Examiner:
Attorney: Trifari; Frank R.