Title: Electrical temperature measuring resistor structure, particularly for resistance thermometers

Abstract: A substrate carrier of electrically non-conductive material has a strip of resistance platinum applied thereto; in order to avoid the use of an intermediate temperature coefficient of expansion matching layer, the substrate carrier, for example of aluminum oxide, beryllium oxide, or a magnesium silicate, has less than thirty parts per million (ppm) Fe, less than 15 ppm Cr, less than 45 ppm Pb and less than 70 ppm Si in a form capable of reacting with platinum, the sum of the impurities by these metals, if all, or more than one are present, not exceeding 20 ppm; the average thermal coefficient of expansion of the substrate does not deviate from the mean thermal coefficient of expansion of the thermometer grade platinum by more than .+-. 30%; the platinum layer has a thickness of from 0.1 to 10 .mu.m, and is applied at a temperature in the range of between about 1000.degree. C to 1400.degree. C during 60 minutes in an atmosphere containing oxygen, for example free air.

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Inventors: Reichelt, Walter (Hanau, DT)
Sauer, Gunter (Maintal, DT)

Application Number: 695783
Filing Date: 1976-06-14
Publication_date: 1977-09-20
Assignee: W. C. Heraeus GmbH (Hanau, DT)
Primary Class(es): 338/308 338/25, 338/28, 338/307, 338/314
Other Classes:
US Patent Ref:

2802925	Aug, 1957	Von Seelen et al.	338/28.
3412043	Nov, 1968	Gilliand	252/514.
3781749	Dec, 1973	Sidney et al.	338/25.
3845443	Oct, 1974	Fisher	338/28.

Other Refs:
Primary Examiner: Padgett, Benjamin R.
Assistant Examiner: Lloyd, Josephine
Attorney: Flynn & Frishauf