Title: X-ray examining apparatus including a tomographic exposure installation

Abstract: An X-ray examining apparatus including a tomographic exposure installation, with an adjusting or positioning drive for the laminagraphic height displacement, as well as an installation for effecting the marking or indentifying of the currently set laminagraphic height on the tomographic X-ray exposures. In an X-ray examining apparatus of the above-mentioned type there is, accordingly, inventively associated with the X-ray film sheets which are being exposed, a scale or graduated dial which is provided with laminagraphic height gradations and coupled with the positioning drive for the laminagraphic height for the imaging of the area identifying the currently set laminagraphic height.

Do you think this is a good invention? Vote now:

Votes so far: For:(0) Against:(0)
Other info:

Inventors: Berger, Helmut (Erlangen, DT)
Holzermer, Gunther (Erlangen, DT)
Kirsch, Harry (Erlangen, DT)
Vijlbrief, Pieter (Leiden, NL)

Application Number: 604079
Filing Date: 1975-08-12
Publication_date: 1977-09-20
Assignee: Siemens Aktiengesellschaft (Berlin & Munich, DT)
Primary Class(es): 378/21 378/26, 378/165
Other Classes:
US Patent Ref:

2936370	May, 1960	Green et al.	250/476.
3263647	Aug, 1966	Murphy et al.	250/476.
3714428	Jan, 1973	Gasaway	250/476.
3818220	Jun, 1974	Richards	250/445.

Other Refs:
Primary Examiner: Willis, Davis L.
Assistant Examiner:
Attorney: Hill, Gross, Simpson, Van Santen, Steadman, Chiara & Simpson