Title: Photoelectric measuring device

Abstract: A transparent photocell formed of two thin film layers of a semi-conductor material and an intervening thin film layer of a photoconductor material, a constant voltage being applied across the semi-conductor layers and the current through the cell being detected as a measure of the intensity of light incident on the cell. The thin film nature of the cell enables it to be combined with a lens of an optical system as a plurality of laminae coated onto a surface of said lens.

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Inventors: Kuehnle, Manfred R. (Lexington, MA, US)

Application Number: 717169
Filing Date: 1976-08-24
Publication_date: 1977-09-20
Assignee: Coulter Information Systems, Inc. (Bedford, MA)
Primary Class(es): 250/214.1 257/E31.093
Other Classes:
US Patent Ref:

3556787	Jan, 1971	Letter	357/30.
3693013	Sep, 1972	Dueker	357/30.
3739174	Jun, 1973	Gloge	250/201.

Other Refs:
Primary Examiner: Nelms, David C.
Assistant Examiner:
Attorney: Silverman & Cass, Ltd.