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Primary Examiner: Evans, F. L.
Assistant Examiner:
Attorney: Tedesco; S. P., Rockwell; Stephen E.

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Title: Standard for spectral reflectance

Abstract: A standard, which is of ceramic material and preferably includes alumina, for spectral reflectance for use in near infrared reflectance measurements of constituents of samples, which constituents comprise oil, moisture and protein. The standard reflects electromagnetic radiation in the wavelength range of 1.0 - 2.5 micrometers and exhibits its best optical characteristics in the operational range of 1.4 - 2.4 micrometers.

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Inventors: Judge, John F. X. (Yorktown Heights, NY, US)
Salpeter, Jerome (Yorktown Heights, NY, US)

Application Number: 585008
Filing Date: 1975-06-09
Publication_date: 1977-09-06
Assignee: Technicon Instruments Corporation (Tarrytown, NY)
Primary Class(es): 250/338.5 250/252.1, 250/338.1, 356/51, 356/243.4, 356/446
Other Classes:
US Patent Ref:

3504963	Apr, 1970	Davies et al.	250/228.
3776642	Dec, 1973	Anson et al.	356/188.

Other Refs: Other References: Price List of the Diano/Hardy Spectrophotometer, Pl. 101, July 15, 1970, pp. 1 and 2.