Title: Self-compensating X-ray or .gamma.-ray thickness gauge

Abstract: A gauge for determining the mass per unit area, or alternatively the thickness of sheet material by measuring the attenuation, as well as backscatter, of an X-ray beam or the like, while continuously taking into account deviations and changes in localized material composition, insofar as these have an effect on the transmission coefficient of the beam. Electrical signals representing these deviations are combined with calibration data for given material nominal properties, i.e., nominal composition. The resultant and output signal represents the mass per unit area or thickness.

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Inventors: Allport, John J. (Saratoga, CA, US)

Application Number: 702285
Filing Date: 1976-07-02
Publication_date: 1977-09-06
Assignee:
Primary Class(es): 378/90 162/263, 378/53, 378/56, 702/137, 702/172
Other Classes:
US Patent Ref:

3210545	Oct, 1965	Barnett	250/358.
3569708	Mar, 1971	Weinbaum et al.	250/360.

Other Refs:
Primary Examiner: Willis, Davis L.
Assistant Examiner:
Attorney: Schneck, Jr.; Thomas