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Title: Position indicating system and methods

Abstract: An apparatus and method are provided for indicating the location of a device such as a machine tool component or an inspection probe so as to permit the automatic control thereof or the derivation of information defining its position for automatically measuring the dimensions of a work piece. The apparatus includes a scale containing digital information recorded along its length and a photo-optical scanning means for the scale operable to generate a parallel code on its output, such as a binary code, which is indicative of the relative location of the scanning means and the scale. In one form, the scale is connected to a machine tool component and a photoelectric scanning means is held stationary while the component moves relative thereto wherein the output of the scanning means is indicative of the relative position between the component and the scanning means or the degree of movement of the component from a home location. In another form, the scanning means moves with the machine component and scans the digital scale which is fixed relative thereto. The output of the scanning means may be gated to a receiver connected to a recorder, a digital display or a comparator for receiving signals when a sensor in the component senses the surface of the work so as to indicate if the surface is or is not located at a desired location.


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Inventors: Lemelson, Jerome H. (Metuchen, NJ, US)

Application Number: 470823
Filing Date: 1974-05-17
Publication_date: 1977-09-06
Assignee:
Primary Class(es): 250/237G 318/569, 341/13, 901/47
Other Classes:
US Patent Ref:
3078404Feb, 1963Dumaire250/231.
3164909Jan, 1965Rosenberg33/174.
3226833Jan, 1966Lemelson356/167.
3261968Jul, 1966Gale340/347.
3284618Nov, 1966Gotz318/569.
3307172Feb, 1967Kolb346/1.
3358202Dec, 1967Pabst et al.250/231.
3387139Jun, 1968Gerard et al.250/237.
3476481Nov, 1969Lemelson356/167.
3481042Dec, 1969Lemelson33/174.
3562536Feb, 1971Brunner250/566.
3573471Apr, 1971Kolb250/568.
3636635Jan, 1972Lemelson33/174.

Other Refs:
Primary Examiner: Nelms, David C.
Assistant Examiner:
Attorney: