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Title: Determining element concentrations in samples
Abstract:
The invention provides a method and apparatus for determining the concentration of an element such as a heavy metal in a matrix of a material such as rock by the X-ray or gamma-ray fluorescence technique. It allows the use of this technique where a sample to be analyzed has a rough or jagged surface. The effect of the rough surface is eliminated by adjusting the distance between the source and/or detector from the sample so that the rate of detection of radiation in a reference energy band is maintained constant for all samples, including reference samples used for calibration. The reference band is at least partly outside the band or bands characteristic of the element sought.
Other info: Inventors: Rolle, Rainer (Transvaal, ZA) Application Number: 558190 Filing Date: 1975-03-13 Publication_date: 1977-08-30 Assignee: Ortec Incorporated (Oak Ridge, TN) Primary Class(es): 378/48 250/253 Other Classes: US Patent Ref:
Other Refs: Other References: Detection Limit for Gold by Radioisotopic X-Ray Analysis Burkhalter & Marr, International Journal of Applied Radiation & Isotopes, (pp. 395-403) 1970, vol. 21. Some Aspects of X-ray Fluorescence Spectrometers for Trace Element Analysis Nuclear Instruments and Methods, 101, 1972, (pp. 127-135). | |