Title: Apparatus for tomography comprising a pin hole for forming a microbeam of X-rays

Abstract: In an X-ray generating column, an X-ray microbeam is generated by irradiating a target with a scanning finely focused electron beam and permitting the microbeam to pass a pin hole in a beam guide plate or baffle. The take off direction of the X-ray microbeam is varied by scanning said electron beam over the target. The X-ray microbeam irradiates and passes through a thin slice plane of an object. The X-ray generating column rotates around the object. The rotation and electron beam scanning signals and the output signal of a detector for the X-rays passed through object are memorized by a memory circuit. A calculating circuit then calculates the X-ray absorption coefficient at each micro matrix area on the slice plane of the object, and delivers the respective outputs to an image display means to display an X-ray image of a slice plane of the object.

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Inventors: Watanabe, Eiji (Akishima, JA)

Application Number: 720409
Filing Date: 1976-09-03
Publication_date: 1977-08-30
Assignee: Nihon Denshi Kabushiki Kaisha (Tokyo, JA)
Primary Class(es): 378/10 378/12, 378/17, 378/137
Other Classes:
US Patent Ref:

4002917	Jan, 1977	Mayo	250/445.
4010370	Mar, 1977	Lemay	250/445.

Other Refs:
Primary Examiner: Smith, Alfred E.
Assistant Examiner: Grigsby, T. N.
Attorney: Webb, Burden, Robinson & Webb