Title: Infrared detection system with parallel strip reticle means

Abstract: Optical detectors are arranged along the focal length of a spherical mirr Signals passed by a lens and reflected by the mirror impinge on the detectors as the system scans the horizon. A reticle means is placed between the mirror and the detector to cause the optical system to discriminate against large radiating areas in the field of view of the lens. The reticle means may be straight or zig-zag opaque lines. The cross-sectional area of the lines and the area therebetween is such that radiation from point sources will impinge the detector in only one area at a time while radiation from large sources will overlap a plurality of areas. The output frequency from the detectors is indicative of the type of the radiation source.

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Inventors: Driffield, John B. (Rexdale, CA, US)
Kerr, Howard S. (Scarborough, CA, US)
Penrose, Richard M. (Brampton, CA, US)
Stonell, Anthony C. (Rexdale, CA, US)

Application Number: 144282
Filing Date: 1971-05-18
Publication_date: 1977-05-31
Assignee: The United States of America as represented by the Secretary of the Army (Washington, DC)
Primary Class(es): 250/339.02 250/338.1, 257/E31.122, 359/356, 359/359
Other Classes:
US Patent Ref:

3144554	Aug, 1964	Whitney	250/83.
3204100	Aug, 1965	Wormser et al.	250/83.
3279308	Oct, 1966	Bartz et al.	350/1.
3318650	May, 1967	Papp	250/83.
3353022	Nov, 1967	Schwartz	250/83.
3398285	Aug, 1968	Sachs	250/83.
3402296	Sep, 1968	Benedict et al.	250/83.
3448283	Jun, 1969	Higley et al.	250/83.
3519825	Jul, 1970	Locks	250/83.
3853386	Dec, 1974	Ritter et al.	350/1.
3872308	Mar, 1975	Hopson et al.	250/338.
3879607	Apr, 1975	Bjorkland	250/339.

Other Refs:
Primary Examiner: Nelson, Peter A.
Assistant Examiner:
Attorney: Edelberg; Nathan, Gibson; Robert P., Dunn; Aubrey J.