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Title:
Controlling the oxygen content of Czochralski process of silicon crystals by sandblasting silica vessel
Abstract:
The oxygen content of silicon crystals, which are drawn from a silicon melt contained in a silica vessel according to the Czochralski process, is controlled by changing the surface characteristics of the portion of the silica vessel which is in contact with the melt so as to provide an increased oxygen concentration in the melt during the crystal drawing process.
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Inventors:
Patrick, William John (Poughkeepsie, NY, US) Scilla, Salvatore James (Marlboro, NY, US) Westdorp, Wolfgang Alfred (Hopewell Junction, NY, US)
Application Number:
581307
Filing Date: 1975-05-27 Publication_date: 1977-03-01 Assignee:
International Business Machines Corporation (Armonk, NY)
Primary Class(es):
117/208
117/900, 117/932
Other Classes:
US Patent Ref:
Other Refs:
658,110| Dec, 1965 | BE | | 797,377Jul, 1958 | UK | | | | | | | |
Other References:
Lawson et al., Preparation of Single Crystals, London, Butterworths Sci. Pub., 1958, pp. 125-129. Hartman et al., Metal Progress, Oct. 1956, pp. 100-103. Dash, Journal of App. Phy., vol. 29, No. 4, Apr. 1958, pp. 736 and 737. Hannay, Semi-Conductors, Monograph Series No. 140, 1960, pp. 107-110. |