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Title:
Apparatus for detecting defect locations at the surface of a moving reflecting material
Abstract:
Apparatus for detecting defect locations at the surface of a moving reflecting material comprising a light source and a first optical system which directs the light thereof successively upon surface regions of the material situated along a line extending essentially transversely to the direction of movement of the material. A photoelectric transducer and a second optical system are provided, the second optical system collecting the light reflected from the individual surface regions at the transducer. An indicator device or mechanism which as a function of the intensity of the light reflected by each surface region produces a signal, especially an optical signal, which is associated with the relevant surface region. According to the invention the light source is a laser light source, the first optical system splits up the laser beam into an essentially two-dimensional parallel bundle of rays, the plane of which intersects the surface of the material to be examined approximately perpendicularly and which grazingly impinges upon the material surface, especially at an angle less than 5.degree., and that in the path of the rays of the light impinging upon the material there is arranged a movable diaphragm which periodically only frees individual partial regions of the planar bundle of rays.
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Inventors:
Roulier, Alfred (Neuenegg, CH) Kamber, Walter (Marly, CH)
Application Number:
545468
Filing Date: 1975-01-30 Publication_date: 1976-11-16 Assignee:
Ciba-Geigy AG (Basel, CH)
Primary Class(es):
356/431
250/559.02, 250/559.48, 359/235
Other Classes:
US Patent Ref:
Other Refs:
666,513| Oct, 1938 | DT | | 880,135Oct, 1961 | UK | | | | | | | |
Primary Examiner:
Corbin, John K.
Assistant Examiner:
Rosenberger, Richard A.
Attorney:
Falber; Harry, Jorda; Karl F.
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