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Title: Method of fabricating semiconductor device using at least two sorts of insulating films different from each other

Abstract: A lateral transistor or the like is made by the steps of forming a first insulating layer on a semiconductor substrate and providing a first hole in this insulating layer so as to expose a first surface portion of the substrate. An impurity of a first conductivity type is introduced through the hole and a second hole is formed in the insulating layer so as to expose a second surface portion of the substrate spaced apart from the first portion. Then, a second insulating layer of a material different from that of the first layer is formed on the first insulating layer and on the first and second surface portions of the substrate. Subsequently, third and fourth holes are formed in the second insulating layer within the confines of these holes to expose at least portions of the first and second surface portions of the substrate. Then, an impurity of a second conductivity type is introduced into the exposed first and second surface portions of the substrate through the third and fourth holes.


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Inventors: Imaizumi, Ichiro (Kokubunji, JA)
Kaji, Tadao (Kokubunji, JA)
Hayasaka, Akio (Kokubunji, JA)
Uehara, Keijiro (Tokyo, JA)

Application Number: 500067
Filing Date: 1974-08-23
Publication_date: 1976-08-31
Assignee: Hitachi, Ltd. (JA)
Primary Class(es): 438/339 148/DIG43, 148/DIG85, 148/DIG96, 148/DIG106, 148/DIG114, 148/DIG167, 257/E21.033, 257/E29.187, 438/357, 438/377, 438/546, 438/552
Other Classes:
US Patent Ref:
3342650Sep, 1967Seki et al.148/187.
3484313Dec, 1969Tauchi et al.148/187.
3660735May, 1972McDougall148/1.
3681153Dec, 1970Clark et al.148/187.
3793088Feb, 1974Eckto, Jr.148/187.
3798080Mar, 1974Henning et al.148/187.

Other Refs:
Primary Examiner: Rutledge, L. Dewayne
Assistant Examiner: Davis, J. M.
Attorney: Craig & Antonelli