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Primary Examiner: Smith, Alfred E.
Assistant Examiner: Punter, Wm. H.
Attorney: Cooper, Dunham, Clark, Griffin & Moran

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Title: Dielectric apparatus and method utilizing resonance for humidity measurement

Abstract: Apparatus for humidity measurement employing a dielectric resonator consisting essentially of a metallic guard, a solid dielectric material, an input antenna and an output antenna. Method of measuring humidity comprising feeding a microwave energy of swept frequencies to the input antenna of said appratus, recovering said energy as a microwave power from the output antenna, and then determining the humidity of the gas through which the microwave energy travels from one antenna to the other, the value of humidity being based on the frequency characteristic of said microwave power.

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Inventors: Miura, Taro (Tokyo, JA)
Yamamoto, Takahiro (Tokyo, JA)

Application Number: 527072
Filing Date: 1974-11-25
Publication_date: 1976-03-23
Assignee: TDK Electronics Co., Ltd. (Tokyo, JA)
Primary Class(es): 324/634 73/335.02, 324/636, 324/653
Other Classes:
US Patent Ref:

2792548	May, 1957	Hershberger	324/58.
2882493	Apr, 1959	Dicke	324/58.

Other Refs: Other References: Jaeger et al., "Microwave Measurements of the Loss in Low Loss Dielectrics," Rev. of Sci. Instruments, Vol. 41, June 1970, pp. 820-823.
Magee et al., "Recording Microwave Hygrometer," Rev. of Sci. Instruments, Vol. 29, Jan. 1958, pp. 51-54.
Berliner et al., "Phase-Sensitive Ultrahigh-Frequency Moisture Gauge," Ind. Lab(USA), Vol. 37, Oct. 1971, pp. 1624-1626.