Title: Dual base line interferometer antenna

Abstract: A radar system for determining the position of a target using a radio frency source of opportunity. The system uses an interferometer antenna and cross-correlation techniques to measure the time delay in receiving a reflected signal from the target as compared to receiving a direct signal from the signal source. Thereby, the distance from the RF source via the target to the antenna is determined. Additionally, the system uses a plurality of interferometer antennas and cross-correlation techniques to measure the relative phase difference between the signals received by the antennas. Thereby the angle of arrival of the reflected signals from the target is determined. Combining the range and angular information locates the target.

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Inventors: Afendykiw, Marko (Ann Arbor, MI, US)
Boyle, John M. (China Lake, CA, US)
Hendrix, Charles E. (Pacific Palisades, CA, US)

Application Number: 092159
Filing Date: 1970-11-23
Publication_date: 1976-03-09
Assignee: The United States of America as represented by the Secretary of the Navy (Washington, DC)
Primary Class(es): 342/156 342/13, 342/378, 342/453
Other Classes:
US Patent Ref:

2546970	Apr, 1951	Busignies	343/112.
2639422	May, 1953	Harris	343/112.
2971190	Feb, 1961	Busignies	343/112.
3154778	Oct, 1964	Kock	343/5.
3303503	Feb, 1967	Stabilito	343/16.
3510871	May, 1970	Watanabe et al.	343/16.
3540054	Nov, 1970	Broderick	343/113.

Other Refs:
Primary Examiner: Hubler, Malcolm F.
Assistant Examiner:
Attorney: Sciascia; R. S., Miller; Roy, Adams; Robert W.