PatentVote.com: Vote on your favourite invention!

Next ten patents ordered by date:
Vehicle speed signal pulse source
Emergency communications system
Walkie-talkie device
Security remote control method and system
Debugging arrangement
Dynamic antenna tuner
Automobile active receiving antenna
Radio receiver with a phase locked loop for a demodulator
Noise-squelching circuit using a phase-locked loop
Method and arrangement for furnishing an indication of multipath reception in an FM receiver
Translate:
En
De
Es
Fr
It
Pt
Ja
Ko
Zh 

 

Title: Method of and device for measuring life time of carriers of semiconductor

Abstract: There is disclosed a method of and device for measuring characteristics of a semiconductor by way of a microwave. The variation with time in the concentration of carriers which are produced in the semiconductor by applying an energy thereto from an external energy source such as light source is measured by way of a reflected microwave of an incident microwave directed to a portion of the semiconductor through a tapering antenna, whereby the life time of carriers in the semiconductor is determined.


Do you think this is a good invention? Vote now:

 Votes so far: For:(0) Against:(0)
Other info:


Inventors: Terasawa, Yoshio (Hitachi, JA)

Application Number: 491230
Filing Date: 1974-07-24
Publication_date: 1976-02-17
Assignee: Hitachi, Ltd. (JA)
Primary Class(es): 324/767 324/642
Other Classes:
US Patent Ref:
2859407Nov, 1958Henisch324/158.
3206674Sep, 1965Thuy et al.324/158.
3500204Mar, 1970Stromer324/58.

Other Refs:
Primary Examiner: Smith, Alfred E.
Assistant Examiner: Karlsen, Ernest F.
Attorney: Craig & Antonelli