Title: Sheet material characteristic measuring, monitoring and controlling method and apparatus using data profile generated and evaluated by computer means

Abstract: A sheet material characteristic monitoring apparatus is provided for use in processes involving the production and contouring of sheet material. In a preferred embodiment, the sheet material characteristic is measured at two or more stationary cross direction locations of the sheet. A digital computer computes a regression equation between the measured values of the sheet characteristic and their respective locations, which equation is evaluated between limits representing the sheet edges to provide a data profile comprising estimated values of the sheet characteristic across the width of the sheet. The data profile may be derived substantially instantaneously. The data profile may further be evaluated between limits representing one or more desired transverse dimensions of the sheet.

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Inventors: Donoghue, John Francis (Columbus, OH, US)

Application Number: 464947
Filing Date: 1974-04-29
Publication_date: 1976-02-03
Assignee: Industrial Nucleonics Corporation (Columbus, OH)
Primary Class(es): 700/129 162/252, 162/DIG10, 162/DIG11, 702/170
Other Classes:
US Patent Ref:

3307215	Mar, 1967	Gerhard et al.	235/151.
3510374	May, 1970	Walker	162/259.
3552203	Jan, 1971	Freeh	73/159.
3610897	Oct, 1971	Gerhard et al.	235/151.
3626165	Dec, 1971	McCall	235/151.

Other Refs:
Primary Examiner: Ruggiero, Joseph F.
Assistant Examiner:
Attorney: Lowe; Allan M., Fryer, III; William T., Nielsen; Walter R.