Title: Measurement apparatus influenced by disturbing ambient temperature fluctuations

Abstract: A measurement apparatus influenced by disturbing ambient temperature variations or fluctuations, said measurement apparatus having a limited volume filled with a medium subjected to such temperature fluctuations. Further, there is provided a compensation element which, under the influence of such disturbing temperature fluctuations, alters the size of a compartment which also contains the medium and thus also alters the aforementioned volume. The dimensions and the coefficient of thermal expansion of the compensation element, while taking into account the coefficient of thermal expansion and the quantity of medium contained in such compartment, are chosen such that the influence of the disturbing temperature fluctuations on the apparatus is compensated.

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Inventors: Posnansky, Mario (Horgen, CH)

Application Number: 421272
Filing Date: 1973-12-03
Publication_date: 1976-01-27
Assignee: Haenni & Cie Aktiengesellschaft (Jegenstorf, CH)
Primary Class(es): 374/197 73/708, 73/741, 374/203
Other Classes:
US Patent Ref:

2053974	Sep, 1936	Smith	73/368.
2088032	Jul, 1937	Noble	73/362.
3411360	Nov, 1968	Denner	73/362.
3808893	May, 1974	Jinno et al.	73/61.

Other Refs: 277,326841,798

Jul, 1970	SU
Jun, 1952	DT

Primary Examiner: Myracle, Jerry W.
Assistant Examiner: Roskos, Joseph W.
Attorney: Kleeman; Werner W.